ELECTRICAL CONDUCTION AT HIGH FIELDS IN SINGLE-INJECTION, SOLID-STATE DIODES WITH TRAPS LYING ABOVE THE FERMI LEVELSSHARMA YK.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 2; PP. 1241-1243; BIBL. 6 REF.Article

SPACE CHARGE LIMITED CURRENT IN AN INSULATOR AT HIGH FIELDSSHARMA YK.1980; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1980; VOL. 16; NO 23; PP. 896-897; BIBL. 4 REF.Article

SURFACE FLICKER NOISE IN P-N JUNCTION DIODES AT A HIGH INJECTION LEVEL.SHARMA YK.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 3; PP. 1380; BIBL. 5 REF.Article

HOT CARRIER EFFECT IN THE SINGLE INFECTION SOLID STATE DIODES WITH SHALLOW TRAPS.SHARMA YK.1976; REV. ROUMAINE PHYS.; ROUMAN.; DA. 1976; VOL. 21; NO 1; PP. 63-67; BIBL. 8 REF.Article

THERMAL NOISE IN SINGLE INJECTION DIODE WITH TRAPS.SHARMA YK.1975; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1975; VOL. 13; NO 11; PP. 741-745; BIBL. 16 REF.Article

LOW FREQUENCY NOISE IN THE TRAP FREE INSULATED DIODE WITH THERMAL FREE CARRIERS.SHARMA YK.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 9; PP. 1350-1352; BIBL. 6 REF.Article

EVALUATION OF CRITICAL CURRENTS & VOLTAGES IN THE SINGLE INJECTION CURRENT IN AN INSULATORSHARMA YK.1980; INDIAN J. PURE APPL. PHYS.; ISSN 0019-5596; IND; DA. 1980; VOL. 18; NO 10; PP. 812-815; BIBL. 9 REF.Article

ELECTRICAL CONDUCTION OF HOT CARRIERS IN SINGLE-INJECTION SOLID-STATE DIODES WITH EXPONENTIAL TRAP DISTRIBUTIONSHARMA YK.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 8; PP. 5381-5386; BIBL. 17 REF.Article

LOW FREQUENCY NOISE IN THE TRAP FILLED DIODE UNDER CRITICAL CONDITION.SHARMA YK.1978; REV. ROUMAINE PHYS.; ROUMAN.; DA. 1978; VOL. 23; NO 1; PP. 81-82; ABS. FR.; BIBL. 4 REF.Article

THERMAL NOISE IN THE TRAP FREE INSULATED DIODE WITH THERMAL FREE CARRIERS.SHARMA YK.1974; SOLID-STATE ELECTRON.; G.B.; DA. 1974; VOL. 17; NO 7; PP. 762-763; BIBL. 3 REF.Article

POINT-CONTACT INJECTION AT HIGH FIELDS IN INSULATOR WITH TRAPS & THERMAL FREE CARRIERSSHARMA YK.1982; INDIAN J. PURE APPL. PHYS.; ISSN 0019-5596; IND; DA. 1982; VOL. 20; NO 2; PP. 130-132; BIBL. 5 REF.Article

LOW FREQUENCY NOISE IN THE SINGLE INJECTION DIODE WITH TRAPS LYING ABOVE THE FERMI LEVEL.SHARMA YK.1976; INDIAN J. TECHNOL.; INDIA; DA. 1976; VOL. 14; NO 11; PP. 576-577; BIBL. 11 REF.Article

HOT CARRIER INJECTION IN SPHERICAL SOLID STATE DIODESSHARMA YK.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 57; NO 2; PP. K109-K112; BIBL. 3 REF.Article

ELECTRICAL CONDUCTION & NOISE BEHAVIOUR OF HOT CARRIERS IN SINGLE INFECTION SOLID STATE DIODES WITH THERMAL FREE CARRIERS.SHARMA YK.1977; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1977; VOL. 15; NO 8; PP. 574-579; BIBL. 11 REF.Article

SURFACE FLICKER NOISE IN P-I DIODES.SHARMA YK.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 34; NO 1; PP. K87-K89; BIBL. 4 REF.Article

NOISE OF HOT CARRIERS IN SINGLE-INJECTION SOLID-STATE DIODES WITH TRAPS LYING BELOW THE FERMI LEVEL.SHARMA YK.1974; PHYS. REV., B; U.S.A.; DA. 1974; VOL. 10; NO 8; PP. 3273-3279; BIBL. 29 REF.Article

SCALING LAW FOR HOT-CARRIER INJECTION IN INSULATORS.SHARMA YK; SRIVASTAVA BB.1974; SOLID-STATE ELECTRON.; G.B.; DA. 1974; VOL. 17; NO 11; PP. 1214-1215; BIBL. 2 REF.Article

EXACT J/V CHARACTERISTIC OF AN INSULATOR DIODE WITH THERMAL FREE CARRIERS IN NONCONSTANT MOBILITY REGIMESHARMA YK; RAGHAV VS.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 10; PP. 355-356; BIBL. 5 REF.Article

AN ACCESS CONTROL FACILITY FOR RELATIONAL DATA BASE SYSTEMSSHARMA KD; SHARMA YK.1980; INFORM. SYST.; GBR; DA. 1980; VOL. 5; NO 1; PP. 33-39; BIBL. 11 REF.Article

HOT CARRIER EFFECT IN SINGLE INJECTION DIODE WITH THERMAL FREE CARRIERS.SHARMA YK; SRIVASTAVA BB.1975; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1975; VOL. 27; NO 2; PP. 633-638; ABS. ALLEM.; BIBL. 8 REF.Article

THERMAL NOISE IN THE TRAP-FILLED DIODE.SHARMA YK; SRIVASTAVA BB.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 9; PP. 4123; BIBL. 4 REF.Article

AN INTEGRATED DATA BASE LANGUAGEPRAKASH N; SHARMA YK.1979; SIGPLAN NOT.; USA; DA. 1979; VOL. 14; NO 7; PP. 82-96; BIBL. 16 REF.Article

LOW FREQUENCY NOISE IN SPACE CHARGE LIMITED SOLID STATE DIODE NEGLECTING DIFFUSION.SHARMA YK; SRIVASTAVA BB.1974; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1974; VOL. 12; NO 2; PP. 169-170; BIBL. 1 REF.Article

EVALUATION OF PHYSICO CHEMICAL CHARACTERISTICS DETERMINING THE CHAPATI MAKING QUALITIES OF TRITICALE.SHARMA YK; DEODHAR AD; MISHRA A et al.1977; INDIAN J. NUTRIT. DIET.; INDIA; DA. 1977; VOL. 14; NO 5; PP. 140-143; BIBL. 12 REF.Article

TRENDS IN NUCLEAR RESEARCH AND ITS PUBLICATIONS - AN ANALYSIS BASED ON FIVE YEARS COVERAGE IN THE INDIAN SCIENCE ABSTRACTSVERMA RK; SHARMA YK; KHATRI HSD et al.1982; ANNALS OF LIBRARY SCIENCE AND DOCUMENTATION; ISSN 0003-4835; IND; DA. 1982; VOL. 29; NO 2; PP. 64-69; BIBL. 3 REF.Article